Mini ATE
Automatic Test Equipment designed as a complete solution for modern mixed-signal IC testing.
Quantity
Overview
A compact automated test equipment (ATE) platform that integrates digital vector generation with analog force and measurement capability directly into a single test vector. By coordinating digital and analog operations under strict timing requirements, Mini ATE minimizes setup time and ensures precise, synchronized timing for accurate and reliable mixed-signal testing
Key Features
8 digital channels with 100 MHz vector-based pattern generation
2 analog channels for integrated force and measurement
Digital pin electronics from -1.5 V to 5 V with active load capability
Analog force voltage up to ±20 V and force current up to ±1 A
Intuitive GUI for developing and managing test patterns — import, edit, or create patterns, configure pin maps, define levels, and set timing
Manual and automatic vector creation
XML-based configuration and pattern file saving/reloading
Built-in Common Protocol support for I²C, SPI, and UART — automatically assigns pin maps, levels, and timing per pin
Specifications
Parameter | Value |
Channels | 8 Digital Channels, 2 Analog Channels |
Digital Pin Electronics | -1.5 V to 5 V |
Maximum Vector Rate | 100 MHz (10 ns minimum vector period) |
Pattern Timing | 8 time sets, 10 ns edge placement resolution |
Drive Formats | Non-Return (NR), Return-to-Low (RL), Return-to-High (RH) |
Vector Memory Depth | 65 K |
Opcode Support | Repeat, for_loop, jump, jump_if |
Analog Force Update Rate | Up to 1 MUPS |
Analog Measurement Sampling Rate | Up to 1 MUPS |
Voltage Range | ±20 V |
Current Range | ±1 A |
Analog Settling Time | < 5 µs |
Analog Edge Placement Resolution | 10 ns |