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Digital Pattern Control
Generate high-speed digital test vectors with configurable timing and drive formats to provide consistent, deterministic stimulation to the DUT.
Analog Force & Measurement
Apply controlled voltage and current while accurately measuring the DUT’s analog response for reliable mixed-signal testing.
Precision Timing & Synchronization
Synchronize digital patterns, analog stimulus, and measurement events with precise timing to enable deterministic mixed-signal testing.
One Platform. Complete Test Control.
Seamlessly combine digital stimulus, analog measurement, and precision timing for mixed-signal IC testing.
One Platform. Complete Test Control.
Seamlessly combine digital stimulus, analog measurement, and precision timing for mixed-signal IC testing.
Digital Pattern Control
Generate high-speed digital test vectors with configurable timing and drive formats to provide consistent, deterministic stimulation to the DUT.
Analog Force & Measurement
Apply controlled voltage and current while accurately measuring the DUT’s analog response for reliable mixed-signal testing.
Precision Timing & Synchronization
Synchronize digital patterns, analog stimulus, and measurement events with precise timing to enable deterministic mixed-signal testing.
Precise Timing
Deterministic timing for accurate edge placement and event control across test sequences.
Mixed-Signal Testing
Seamlessly integrate digital signals with analog force and measurement in one test environment.
Pattern Control
Create, configure, and manage complex test patterns with an intuitive workflow.
Protocol-Based Testing
Generate test vectors using industry-standard protocols, including I²C, SPI, and UART.
Why Mini ATE?
Everything you need to simplify complex IC testing in one integrated platform.
Product Specifications
Indicator | Specification |
|---|---|
Channels | 8 Digital Channels, 2 Analog Channels |
Digital Pin Electronic | -1.5 V to 5 V |
Maximum Vector Rate | 100 MHz (10 ns minimum vector period) |
Pattern Timing | 8× time set; 10 ns edge placement resolution |
Drive Formats | Non-Return (NR), Return-to-Low (RL), Return-to-High (RH) |
Vector Memory Depth | 65K |
Opcode Support | Repeat, for_loop, jump, jump_if |
Analog Force Update Rate | Up to 1 MUPS |
Analog Measurement Sampling Rate | Up to 1 MSPS |
Voltage Range | ±20 V |
Current Range | ±1 A |
Analog Settling Time | < 5 μs |
Analog Edge Placement Resolution | 10 ns |
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